Founded by optics and photonics entrepreneurs Clare Murphy and Dominic Murphy, Layer Metrics Inc. develops optical metrology and sensing systems that monitor and control advanced manufacturing processes in real time. Its proprietary iDaR™ technology uses synchronized multiplexed measurements to help manufacturers reduce yield loss, including in high-value semiconductor and additive manufacturing applications. CTO Dominic Murphy brings more than 25 years of experience commercializing in-line optical monitoring instruments.
LumetricsBorn in Rochester in 2003 from optical research at Eastman Kodak, Lumetrics designs and manufactures non-contact thickness measurement and optical inspection systems. Its OptiGauge technology delivers real-time, non-destructive measurements, while its Shack-Hartmann wavefront sensors evaluate optics from contact lenses to laser beams. Lumetrics also works directly with customers to develop custom metrology systems for demanding production, quality, and research applications.ROCHESTER, NY
KLA CorporationBuilt on more than 50 years of innovation, KLA Corporation develops and manufactures the inspection, metrology, process-control and analytics systems that semiconductor makers use to produce advanced chips. Its work spans the chip’s journey from wafer to finished device, with specialized measurement tools also serving fields such as biomedical manufacturing and materials research. KLA operates across 18 regions with approximately 16,000 employees and has traced its semiconductor process-control work to a pioneering mask-inspection tool introduced in 1975.FAIRPORT, NY
VIEW Micro MetrologyVIEW Micro Metrology, a division of Quality Vision International formed in 2005, develops non-contact optical metrology systems and software for measuring tightly toleranced micro-components in production. Its Rochester-based Center of Excellence includes a climate-controlled lab for application studies and software training, while the company’s heritage reaches back to VIEW Engineering’s 1976 introduction of the first video coordinate measuring machine. VIEW systems are ISO 9001 certified through QVI and support high-throughput inspection in semiconductor, electronics and medical manufacturing.ROCHESTER, NY
API MetrologyAPI Metrology grew from founder Dr. Kam Lau’s invention of the laser tracker at NIST in 1983 into a global metrology company with teams on four continents. It develops precision measurement systems and provides expert services that help manufacturers inspect complex work and keep production equipment accurate. Its calibration work is A2LA ISO 17025 certified.ROCKVILLE, MD