XCALIPR Corporation develops advanced metrology equipment for semiconductor manufacturing, using photo-modulated reflectance to measure carrier activation and electronic transport directly on product wafers. Its non-contact Fab Tool evaluates properties such as carrier lifetime, diffusion length, and mobility for in-line process development and control.
KLA CorporationBuilt on more than 50 years of innovation, KLA Corporation develops and manufactures the inspection, metrology, process-control and analytics systems that semiconductor makers use to produce advanced chips. Its work spans the chip’s journey from wafer to finished device, with specialized measurement tools also serving fields such as biomedical manufacturing and materials research. KLA operates across 18 regions with approximately 16,000 employees and has traced its semiconductor process-control work to a pioneering mask-inspection tool introduced in 1975.FAIRPORT, NY
Xallent IncFounded through research partnerships in the Ithaca area, Xallent is an Albany-based semiconductor metrology company known for direct-contact nanoscale testing. Its MEMS-based probes help researchers and chipmakers obtain electrical data from thin films and advanced packages without first creating conventional test pads.ALBANY, NY
AMAG NanometroFrom Schenectady, AMAG Nanometro makes IP-neutral calibration wafers and chips for semiconductor metrology while also developing SimuSEM, software that models scanning electron microscope images and electron interactions with solids. Its AMAG7 wafer program revives and updates the SEMATECH AMAG tradition, with fully characterized artifacts fabricated at NY CREATES and pitch accuracy checked against a national standards organization. The company also provides consulting tied to its wafer and simulation work.SCHENECTADY, NY